DENİZ, A. R. Et Al. 2015. Electrical Characterization of Au Fe3O4 p Si Al Rectifier Devices Depending on X Ray Radiation Dos. INTERNATIONAL SEMICONDUCTOR SCIENCE TECHNOLOGY CONFERENCE 2015 , (İzmir, Turkey).

DENİZ, A. R., ZAKİR, Ç., ŞAHİN, Y., HATİCE, K., MEHMET, Ş., & AYDOĞAN, Ş., (2015). Electrical Characterization of Au Fe3O4 p Si Al Rectifier Devices Depending on X Ray Radiation Dos . INTERNATIONAL SEMICONDUCTOR SCIENCE TECHNOLOGY CONFERENCE 2015, İzmir, Turkey

DENİZ, ALİ Et Al. "Electrical Characterization of Au Fe3O4 p Si Al Rectifier Devices Depending on X Ray Radiation Dos," INTERNATIONAL SEMICONDUCTOR SCIENCE TECHNOLOGY CONFERENCE 2015, İzmir, Turkey, 2015

DENİZ, ALİ R. Et Al. "Electrical Characterization of Au Fe3O4 p Si Al Rectifier Devices Depending on X Ray Radiation Dos." INTERNATIONAL SEMICONDUCTOR SCIENCE TECHNOLOGY CONFERENCE 2015 , İzmir, Turkey, 2015

DENİZ, A. R. Et Al. (2015) . "Electrical Characterization of Au Fe3O4 p Si Al Rectifier Devices Depending on X Ray Radiation Dos." INTERNATIONAL SEMICONDUCTOR SCIENCE TECHNOLOGY CONFERENCE 2015 , İzmir, Turkey.

@conferencepaper{conferencepaper, author={ALİ RIZA DENİZ Et Al. }, title={Electrical Characterization of Au Fe3O4 p Si Al Rectifier Devices Depending on X Ray Radiation Dos}, congress name={INTERNATIONAL SEMICONDUCTOR SCIENCE TECHNOLOGY CONFERENCE 2015}, city={İzmir}, country={Turkey}, year={2015}}