Baydilli, E. 2023. Investigation of the dielectric properties of Au/Bi4Ti3O12-SiO2/n-Si (MFIS) type structures depending on gamma-irradiation. Microelectronics Reliability , vol.140 .

Baydilli, E., (2023). Investigation of the dielectric properties of Au/Bi4Ti3O12-SiO2/n-Si (MFIS) type structures depending on gamma-irradiation. Microelectronics Reliability , vol.140.

Baydilli, ESRA. "Investigation of the dielectric properties of Au/Bi4Ti3O12-SiO2/n-Si (MFIS) type structures depending on gamma-irradiation," Microelectronics Reliability , vol.140, 2023

Baydilli, ESRA E. . "Investigation of the dielectric properties of Au/Bi4Ti3O12-SiO2/n-Si (MFIS) type structures depending on gamma-irradiation." Microelectronics Reliability , vol.140, 2023

Baydilli, E. (2023) . "Investigation of the dielectric properties of Au/Bi4Ti3O12-SiO2/n-Si (MFIS) type structures depending on gamma-irradiation." Microelectronics Reliability , vol.140.

@article{article, author={ESRA EVCİN BAYDİLLİ}, title={Investigation of the dielectric properties of Au/Bi4Ti3O12-SiO2/n-Si (MFIS) type structures depending on gamma-irradiation}, journal={Microelectronics Reliability}, year=2023}