THE ELECTRICAL CHARACTERIZATION of Au F3O4 p Si Al RECTIFYING CONTACT WITH Fe3O4 INTERFACE

DENİZ A. R., ÇALDIRAN Z., ÇOŞKUN F. M., ŞAHİN Y., AYDOĞAN Ş., MERAL K., ...More

İnternational Semiconductor Science Technology Conference, 13 - 15 January 2014

  • Publication Type: Conference Paper / Summary Text
  • Hakkari University Affiliated: Yes