Influence of annealing temperature on the structural optical and electrical properties of amorphous Zinc Sulfide thin films

GÖDE F., GÜNERİ E., KARİPER İ. A., ULUTAŞ C., KIRMIZIGUL F., GÜMÜŞ C.

17th International Conference on Microscopy of Semiconducting Materials 2011, United States Of America, 4 - 07 April 2011, vol.326, pp.12020, (Full Text) identifier

  • Publication Type: Conference Paper / Full Text
  • Volume: 326
  • Doi Number: 10.1088/1742-6596/326/1/012020
  • Country: United States Of America
  • Page Numbers: pp.12020
  • Hakkari University Affiliated: No