Preparation and characterization of crystalline MnS thin films by chemical bath deposition

GÜMÜŞ C., ULUTAŞ C., Esen R., Özkendir O., Ufuktepe Y.

Thin Solid Films, cilt.492, sa.1-2, ss.1-5, 2005 (SCI-Expanded) identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 492 Sayı: 1-2
  • Basım Tarihi: 2005
  • Doi Numarası: 10.1016/j.tsf.2005.06.016
  • Dergi Adı: Thin Solid Films
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.1-5
  • Anahtar Kelimeler: Chalcogenides, Chemical bath deposition, Manganese sulfide, Optical properties
  • Hakkari Üniversitesi Adresli: Evet

Özet

Crystalline γ-MnS thin films were deposited by chemical bath deposition method at 27 °C. The MnS thin films were characterized by X-ray diffraction (XRD), scanning electron microscopy, energy dispersive X-ray analysis (EDAX) and optical absorption spectroscopy. XRD measurements show that the films are crystallized in the wurtzite phase and present a preferential orientation along the c-axis. Only one peak, corresponding to the (002) phase (2θ = 28.26°), appears on the diffractograms. The X-ray absorption fine structure spectroscopy calculation of Mn K-edge in MnS is in agreement with the measured result. The deposited MnS thin films on glass substrates consist of nanocrystalline grains. EDAX analysis shows that average ratio of atomic percentage of Mn : S is 1 : 0.82 so one can conclude that the films are in good stoichiometric ratio. The optical band gap of thin film was estimated to be 3.88 eV. © 2005 Elsevier B.V. All rights reserved.