Preparation and characterization of crystalline MnS thin films by chemical bath deposition

GÜMÜŞ C., ULUTAŞ C., Esen R., Özkendir O., Ufuktepe Y.

Thin Solid Films, vol.492, no.1-2, pp.1-5, 2005 (SCI-Expanded) identifier

  • Publication Type: Article / Article
  • Volume: 492 Issue: 1-2
  • Publication Date: 2005
  • Doi Number: 10.1016/j.tsf.2005.06.016
  • Journal Name: Thin Solid Films
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.1-5
  • Keywords: Chalcogenides, Chemical bath deposition, Manganese sulfide, Optical properties
  • Hakkari University Affiliated: Yes


Crystalline γ-MnS thin films were deposited by chemical bath deposition method at 27 °C. The MnS thin films were characterized by X-ray diffraction (XRD), scanning electron microscopy, energy dispersive X-ray analysis (EDAX) and optical absorption spectroscopy. XRD measurements show that the films are crystallized in the wurtzite phase and present a preferential orientation along the c-axis. Only one peak, corresponding to the (002) phase (2θ = 28.26°), appears on the diffractograms. The X-ray absorption fine structure spectroscopy calculation of Mn K-edge in MnS is in agreement with the measured result. The deposited MnS thin films on glass substrates consist of nanocrystalline grains. EDAX analysis shows that average ratio of atomic percentage of Mn : S is 1 : 0.82 so one can conclude that the films are in good stoichiometric ratio. The optical band gap of thin film was estimated to be 3.88 eV. © 2005 Elsevier B.V. All rights reserved.