Electrical Characterization of Au Fe3O4 p Si Al Rectifier Devices Depending on X Ray Radiation Dos

DENİZ A. R., ZAKİR Ç., ŞAHİN Y., HATİCE K., MEHMET Ş., AYDOĞAN Ş.

INTERNATIONAL SEMICONDUCTOR SCIENCE TECHNOLOGY CONFERENCE 2015, İzmir, Turkey, 11 - 13 May 2015, (Summary Text)

• Publication Type: Conference Paper / Summary Text
• City: İzmir
• Country: Turkey
• Hakkari University Affiliated: Yes